Fri 19 Jul 2024 14:18 - 14:36 at Pitanga - Fault Diagnosis and Root Cause Analysis 2 Chair(s): Xi Zheng

Automatic software fault localization plays an important role in software quality assurance by pinpointing faulty locations for easier debugging. Coverage-based fault localization is a commonly used technique, which applies statistics on coverage spectra to rank faulty code based on suspiciousness scores. However, statistics-based approaches based on formulae are often rigid, which calls for learning-based techniques. Amongst all, Grace, a graph-neural network (GNN) based technique has achieved state-of-the-art due to its capacity to preserve coverage spectra, i.e., test-to-source coverage relationships, as precise abstract syntax-enhanced graph representation, mitigating the limitation of other learning-based technique which compresses the feature representation. However, such representation is not scalable due to the increasing complexity of software, correlating with increasing coverage spectra and AST graph, making it challenging to extend, let alone train the graph neural network in practice. In this work, we proposed a new graph representation, DepGraph, that reduces the complexity of the graph representation by 70% in nodes and edges by integrating interprocedural call graph in the graph representation of the code. Moreover, we integrate additional features – code change information – in the graph as attributes so the model can leverage rich historical project data. We evaluate DepGraph using Defects4j 2.0.0, and it outperforms Grace by locating 20% more faults in Top-1 and improving the Mean First Rank (MFR) and the Mean Average Rank (MAR) by over 50% while decreasing GPU memory usage by 44% and training/inference time by 85%. Additionally, in cross-project settings, DepGraph surpasses the state-of-the-art baseline with a 42% higher Top-1 accuracy, and 68% and 65% improvement in MFR and MAR, respectively. Our study demonstrates DepGraph’s robustness, achieving state-of-the-art accuracy and scalability for future extension and adoption.

Fri 19 Jul

Displayed time zone: Brasilia, Distrito Federal, Brazil change

14:00 - 15:30
Fault Diagnosis and Root Cause Analysis 2Research Papers / Industry Papers at Pitanga
Chair(s): Xi Zheng Macquarie University
14:00
18m
Talk
Illuminating the Gray Zone: Non-Intrusive Gray Failure Localization in Server Operating Systems
Industry Papers
Shenglin Zhang Nankai University, Yongxin Zhao Nankai University, Xiao Xiong Nankai University, Yongqian Sun Nankai University, Xiaohui Nie CNIC, CAS, Jiacheng Zhang Nankai University, Fenglai Wang Huawei Technologies Ltd., Xian Zheng Huawei Technologies Ltd., Yuzhi Zhang Nankai University, Dan Pei Tsinghua University
DOI File Attached
14:18
18m
Talk
Towards Better Graph Neural Network-based Fault Localization Through Enhanced Code Representation
Research Papers
Md Nakhla Rafi Concordia University, Dong Jae Kim Concordia University, An Ran Chen University of Alberta, Tse-Hsun (Peter) Chen Concordia University, Shaowei Wang Department of Computer Science, University of Manitoba, Canada
14:36
18m
Talk
Easy over Hard: A Simple Baseline for Test Failures Causes Prediction
Industry Papers
Zhipeng Gao Shanghai Institute for Advanced Study - Zhejiang University, Zhipeng Xue , Xing Hu Zhejiang University, Weiyi Shang University of Waterloo, Xin Xia Huawei Technologies